Comprehensive Analytical Models of Random Variations in Subthreshold MOSFET’s High-Frequency Performances
MBA
October 21, 2022
Banchuin, R. (2018). Comprehensive analytical models of random variations. In Kim Ho Yeap and Humaira Nisar (Eds.), Complementary metal wxide semiconductor (pp.89-108). London: IntechOpen. DOI: 10.5772/intechopen.72710