Banchuin R and Chaisricharoen R 2019 The SDE based stochastic analysis of active filter In 2019 22nd International Symposium on Wireless Personal Multimedia Communications WPMC p 1 4 Lisbon Portugal IEEE
Banchuin R 038 Chaisricharoen R 2020 March The FDE Based Time Domain Analysis of Nonzero Input Nonzero Damping Ratio Fractional Order Biquadratic System In 2020 Joint International Conference on Digital Arts Media and Technology with ECTI Northern Section Conference on Electrical Electronics Computer and Telecommunications Engineering ECTI DAMT 038 NCON
Banchuin R 038 Chaisricharoen R 2019 July The stochastic analysis of OTA C Filter In 2019 16th International Conference on Electrical Engineering Electronics Computer Telecommunications and Information Technology ECTI CON pp 175 178 n p IEEE
Banchuin R 038 Chaisricharoen R 2019 April An SDE based Stochastic Analysis of Transformer In 2019 Joint International Conference on Digital Arts Media and Technology with ECTI Northern Section Conference on Electrical Electronics Computer and Telecommunications Engineering ECTI DAMT NCON pp 310 313 Nan Thailand ECTI sponsored by IEEE <
Banchuin R 038 Chaisricharoen R 2018 July A tensor algebraic model of On chip monolithic transformer In 2018 15th International Conference on Electrical Engineering Electronics Computer Telecommunications and Information Technology ECTI CON n p IEEE
Banchuin R 038 Chaisricharoen R 2017 Time domain FDE based analysis of active fractional circuit In 2018 International Conference on Digital Arts Media and Technology ICDAMT pp 29 32 IEEE doi 10 1109 ICDAMT 2018 8376490
Banchuin R 038 Chaisricharoen R 2017 The analysis of active circuit in fractional domain In 2018 International ECTI Northern Section Conference on Electrical Electronics Computer and Telecommunications Engineering ECTI NCON pp 21 24 doi 10 1109 ECTI NCON 2018 8378274
Banchuin R 038 Chaisricharoen R 2017 Alpha power law based model of random variation in nanometer FGMOSFET In 2017 International Conference on Digital Arts Media and Technology ICDAMT pp 250 253 IEEE doi 10 1109 ICDAMT 2017 7904971
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